Optical metrology and interferometry

We have a long tradition and extensive experience in the development and application of interferometric measurement methods and their use in production and testing processes.

It is particularly important to us to evaluate the best possible measuring and testing method for your application and to put it into productive use according to your requirements. We have extensive experience in optical surface metrology and deformation metrology. In addition to the application of existing optical measurement technology, the new and further development of optical measurement and testing methods is a focus of our research work.

 

What we can offer you

  • Application-specific selection of optical measurement technology and principles
  • Evaluation and comparison of optical and non-optical measurement methods
  • Development of new optical measurement methods
  • Simulation and modeling of the complete measurement application
  • Development of the required evaluation algorithms and their implementation

Our experience

  • Digital holography
  • Shearography
  • Electronic speckle interferometry (ESPI)
  • Fringe projection, optical triangulation
  • Chromatic distance measurement
  • TOF measurement technology
  • Light field metrology
  • White light interferometry
  • Laser vibrometry
  • Digital 3D image correlation
  • Confocal chromatic methods
  • Microscopy, confocal microscopy
  • Thermography

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